Standard-Performance NED

Products

Overview

Micross Standard-Performance Nuclear Event Detector (NED, Figure 1) provides an economical solution for detecting gamma radiation pulses from a nuclear event. For an overdrive ratio of just 2 (received radiation-to-dose rate threshold), the NED will assert its pulse and level differential output signals within 20ns following the leading edge of an incoming gamma radiation pulse. The NED’s level output may then be reset by the assertion of a differential input signal. The MYXRHNEDSCJ/X features a minimum dose rate threshold of 1 x 10⁵ rads(Si)/sec, thereby providing higher sensitivity than currently available NEDs. Users can increase the dose rate threshold upwards, to up to 2 x 10⁷ rads(Si)/sec, by means of an external adjustment resistor. The Standard Performance NED, which is available in a non-hermetic 44-pin J-Lead ceramic package, is radiation hardened, enabling it to operate reliably in environments with high gamma doses and dose rates, neutrons and heavy ions; and provides immunity to latch up.  It achieves this by using a rad-hard-by-design ASIC designed specifically for this purpose.  Since the ASIC contains the line drivers and receivers on-board as Rad Hard blocks, no additional consideration is need for those functions.

Benefits

• Low Minimum Dose Rate Sensitivity
• Fast Delay Time to Enable Rapid Shutdown and Minimize Damage to Other Electronics
• Rad-Hard for Strategic Environments
• Small Compact Package Facilitates Use on Densely Populated Circuit Cards and Boards
• Built-In Differential Drivers and Receivers Provide SWaP (Space, Weight, & Power) Savings, Improved Noise Immunity, and Reduced Delay Times
• Use Output Signal to Shut Down Power Supplies, Take Processors Offline and Block Memory Write Operations

Features

• Gamma Dose Rate Sensitivity Threshold Range Adjustable from 1 x 10⁵ to 2 x 10⁷ rads (Si) / sec.
• 44-Pin Non-Hermetic Ceramic J-Lead SMT Package (.650in x .650in x .113in)
• Integrated Differential Line Drivers and Receivers
• Total Dose (Device Survivability): 1 x 10⁶ rads (Si)
• Dose Rate (Operate Through): 1 x 10¹² rads (Si) / sec.
• Neutron Fluence (Device Survivability): 5 x 10¹³ neutrons / cm²
• 3.3V Power Requirement
• -55°C to +125°C Temperature Range
• Integrated Differential Line Drivers and Receivers All Operate Through Prompt Dose Without Extra Shielding
• Option to Perform Minimum Dose Rate Threshold Test on Individual Units

Documentation

• Standard-Performance NED Preliminary Datasheet (Rev 1.1)
• Standard-Performance NED Preliminary Product Brief
• Engineering Model NED Datasheet (Rev 1.0)

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