MYXxxSMS04GP32PB1-45/x

Part Number: MYXxxSMS04GP32PB1-45/x

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The Micross 4Gb MRAM Qualified Encapsulated Device (QED), a plastic encapsulated microcircuit screened and Qualified to the NASA electrical, electronic and electromechanical instructions, is a Space Grade, Spin Torque MRAM, manufactured utilizing Avalanche Technologies magneto-resistive random-access memory. This MRAM device, qualified and fully screened to EEE-INST-002, section M4 as a Level 2 PEM is analogous to Flash technology with an SRAM compatible READ/WRITE interface, a Configuration Register with enhanced ECC functionality and a Page Mode feature for improved performance. Data is non-volatile with a near infinite endurance and best in class, non-volatile memory data retention.

Benefits
Optimal Design
  • Smallest Plastic Rad-Tolerant MRAM package available
  • Spin-Torque Transfer technology MRAM is highly resistant to magnetic flux, mitigating the need for radiation shielding
  • Spin-Torque Transfer technology has near infinite endurance and data retention greater than 10 years
  • MRAM memory offers the fastest access time of non-volatile memories
  • Best power profile of all non-volatile memories
    • Standby current: 5.5mA; Active current: 90mA
Flexible Package Options
  • Plastic BGA package available in 142 pad/solder-ball provides integration flexibility
Applications
  • Space grade processor based systems and FPGA boards
  • LEO, MEO, GEO, and HEO space missions
  • Satellites
  • Launch vehicles
  • Space systems and vehicles
  • Aerospace Systems

Key Features
    Technology
    • 22nm pMTJ STT-MRAM (Perpendicular Magnetic Tunnel Junction)
    • Inherently Rad-Hard MRAM technology
    Performance
    • 4Gb of Spin-Torque Persistent MRAM in a single, small footprint & low-profile package (17mm x 15mm x 1.39mm)
      • Density Organization: 4Gb, 128M x 32
    • Advanced ECC with configuration register
    • Asynchronous Page Mode feature
    • Access performance: 45ns min.
    Operating & Environmental Specifications
    • Quality Flows
      • Qualified Encapsulated Device (QED)
        • NASA EEE-INST-002, Sec. M4, Level-2
      • Rad-Tolerant (RT): 100 krad TID
      • Non-Rad
    • Excellent Single Event Effects (SEE) Performance
      • SEU tolerance > 120.7 MeV cm2/mg
      • SEL threshold > 85.4 MeV cm2/mg
    • Operating Voltage Range: VCC: 2.70V - 3.60V
    • Temperature range: -55°C to +125°C
Data Sheet 🔒 Micross Overview Flyer Space-Grade QED MRAM Flyer

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