Environmental Test

Micross utilizes environmental chambers to accelerate deterioration and shorten test cycles by varying temperature and pressure. Electrical testing on the devices in the environmental chambers helps evaluate the effect of the stress on overall device performance. Our environmental testing capabilities include high and low temperature operating limits (HTOL/LTOL), highly accelerated stress test (HAST), high temperature storage life (HTSL), temperature humidity bias (THB) and many others. Micross’ STS Mipitas Facility serves as the reliability laboratory of choice for numerous new products designed by the technological giants of the Silicon Valley and beyond. For additional information, visit www.sts-usa.com.

Key Reliability Test Services

  • Environmental Reliability Tests
  • Life Test/Burn-in (HTOL/LTOL), Junction Regulated
  • HTOL – Dynamic/Static/DC/RF, Junction Controlled
  • Pre-Conditioning/MRT
  • Temperature & Power Cycling
  • Temperature Humidity Bias (THB)
  • HAST, Thermal Shock
  • Autoclave
  • Mechanical Shock, Vibration, Acceleration
  • Fine/Gross Leak — Kr85
  • Temperature/Power Cycle Operating Life
  • Thermal Shock
  • EFR Analysis
  • ESD/Latch-up
  • Acoustic Microscopy
  • X-Ray
  • Shadow Moiré/Warpage Analysis
  • Solderability
  • Salt Atmosphere
  • Particle Impact Noise Detection
  • Other Level III & Sub System

hirayama hast chamber model pc422 r8