Extensive Test & Burn-in Capabilities

• Credence Diamond 10 Mixed Signal 100/250 MHz
• Teradyne J997 100/200 MHz, 72 I/Os
• Teradyne J937 50/100 MHz, 36 I/Os
• 2 Advantest T73xx Mixed Signal Test Systems
• Sentry 21 20/40 MHz
  • 120 Pin High Speed Head
  • 60 Pin High Voltage Head
• Sentry VII 10/20 MHz
  • 60 Pin High Speed Head
  • 60 Pin High Voltage Head
• LTX TS80 Linear/Mixed Signal Test System
• Testronics 201C Discrete Component Test System
• Sub-Nanosecond ECL Logic AC Test System
• Automated Handlers, Pick & Place
• 2 Automated Bench Test Systems
• Large Variety of Standard Bench Test Equipment and High Precision Equipment

Electrical Burn-In/Life Test

Micross Components's engineering staff is experienced and ready to service your device reliability testing needs, including infant mortality life testing and upscreening of commercial plastic components.

Burn-In/Life Test Capability

• Dynamic/Static DSCC Compliant
• Accelerated VCC
• Arrhenius/FIT Rate Calculation
• 100°C, 125°C, 135°C, 145°C & 150°C
• Logic, Linear, PLD, VLSI
• All Memory Technologies
• Infant Mortality EFR
• Functional Check In-Situation
• PDA/Parameter Drift
• Data Retention/Endurance
• 5 Large-Capacity Memory Burn-In Ovens (1.8V -> 2.5V -> 3.3V -> 5V)
• 4 Custom Product Burn-In Ovens (ideally suited for VLSI, LSI, and Logic/Linear)
• 3 Auxiliary Custom Product Ovens (life test, specialty use)

Product Testing

Micross Components has experience in testing a wide range of both memory and logic/linear/VLSI products, and maintain a large library of test programs under strict quality control standards.

• Memory/Memory Modules
  • SRAM/SSRAM
  • DRAM/SDRAM/DDR/DDRII
  • VRAM
  • EEPROM FLASH
  • FIFO
  • Dual-Port RAM
  • NOVRAM
• VLSI/Logic
  • Microprocessors/Microcontrollers/1750A
  • BUS Controllers/1553
  • DTL/TTL/CMOS/ECL
• Linear
  • Operational/Instrumentation Amplifiers
  • Comparators
  • Voltage Regulators/References
• Mixed Signal
  • DACs/ADCs
  • Analog Switches/Analog Multiplexers
• Discretes
  • Diodes/Diode Arrays
  • Transistors/Transistor Arrays
  • MOSFETs/HEXFETs
  • SCRs/Triacs
  • Hall Effect Switches

Electrical Test

Micross Components's engineering staff is experienced and ready to service your electrical evaluation and device reliability testing needs, including upscreening of commercial plastic components.

Micross Components has built a large foundation of test program libraries on a multitude of test platforms with base programs numbering in the thousands, and test hardware fixtures for many hundreds of unique, ceramic and plastic, packages and pin counts.

• -65°C to +150°C
• Group A
• Correlation/Gold Standard
• Modules
• Attributes Data
• Logic, Linear, PLD, VLSI
• All Memory Devices
• Precision High Speed
• Low-Noise PWB Design
• Discrete Components

Memory Device Characterisation

• -65°C to 150°C & Higher Temperatures
• Bit Map
• Parameter Shmoo
• Average & Standard Development (4-corner Characterization)
• Parameter MARGIN
• ICC's over Temperature & VCC
• DC Parameters (Nano-Amp Precision)
• VCC Functional vs. Temperature
• Special Algorithm (Application Specific)
• Sensitivities or Intermittencies
• Noise Margin Performance
• Data Retention Fail Threshold
• Speed
• Timing Sequence (Race Conditions Concerns)
• New Silicon Design Proof
• COTS/iPEMS (Plastic Upscreen)