products & services

Engineering/Analytical Services

  • Component Evaluation and Qualification
  • Time/Temperature Regression Infant Mortality
  • Sub-Assembly Design
  • X-Ray (Test Methods 2012 & 2030)
  • Die Shear Stud Pull (Test Method 2019 or 2027)
  • Bond Strength (Test Method 2011)
  • Resistance to solvents (Test Method 2015)
  • Steam Age/Solderability (Test Method 2003)
  • Salt Atmosphere (Test Method 1009)
  • Thermal Shock (Test Method 1011 - 65°C to 150°C)
  • PIND (Test Method 2020)
  • High Mag Visual > 100X (Test Method 1010)
  • Lead Integrity (Test Methods 2004 & 2028)
  • ESD Testing (Test Method 3015)
  • Temperature Cycling (Test Method 1010 - 65°C to 150°C)
  • Hermetic Testing: Fine Leak/Gross Leak (Test Method 1014)
  • SEM Inspection (Test Method 2018)
  • Centrifuge: up to 40,000Gs (Test Method 2001)
  • Lid Torque (Test Method 2024)
  • Mechanical Shock and Vibration (Test Method 2002 & 2007 resp.)
  • HAST Screening 85/85
  • Internal Water Vapor: RGA (Test Method 1018)
  • Steady-State LIFE Test (Test Method 1005)

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contact info

Alton UK

For further enquires about Device Testing please contact us on the details below.

Tel: +44 (0) 1420 594180
Email: semiconductor@micross.com